with LCD display ingot wafer x ray orientation instrument for silicon
with LCD display ingot wafer x ray orientation instrument for silicon
This Instrument adopts theta and 2 theta principle
The x ray bean on the deteced sample, then reflect on the receiver tube
then we will know the angle of the detected sample, it always appliction the detection of the angle for
single crystal ingot such as silicon, sapphire ingot or wafer
Customized service according to customer individual requirement
we will design the sample fixture according to customer requirement, indivudial service for detected sample size, sample plane and
purpose of the measurement.
Operation by touchable screen
All operation can be by this screen
Sapphire Ingot measurement
A,C,R,M plane measurement
size from 2 to 10 inch
